Metrology (measurement science and it applications) plays a vital role in the development of society, economy and trade. Therefore, it is closely related with environment, safety, health, and ultimately with our life. At global scale, National Metrology Institutes (NMIs) maintain the national standard as primary responsibility to disseminate the traceability in all related measurements so that highest level of accuracies in such important measurements can be achieved.
For traceability to SI unit, international comparisons are coordinated by the NMIs through Technical Committees (TCs) of Regional Metrology Organizations (RMOs) and Consultative Committees (CCs) of International Committees for Weights and Measures (CIPM). Because of this international structure, the measurements which are linked with a national standard through a NMI are known to be comparable. The metrologists from member NMIs/Designated Institutes (DIs) of these committees meet once/twice in a year to discuss the results of such comparisons, future comparison and needs. Because of the time constraint in these meetings, research and developments, new activities, findings, etc. are limitedly discussed.
The international conference on “Advances in Metrology” is one of the major scientific events organized by the CSIR-National Physical Laboratory, India (NPLI) and Metrology Society of India (MSI) in New Delhi once in every three years. Preceding to this conference, “Pre-AdMet Workshops” are also organized in selected fields of metrology. The major objective of AdMet series of conferences is to provide a unique platform to metrologists, technologists, researchers and students to present their work, share experiences, identify the research areas for collaborations with the fellow scientists from different countries around the world.
9th AdMet was organized during February 21-23, 2016 along with one day pre-AdMet workshop in chemical metrology (February 20, 2016). AdMet–2016 also provided platform to industries having accommodating their stalls to exhibit their products, seeking advice from experts and finding potential ideas in their fields. A number of researchers and metrologists were benefitted by this exhibition as they interacted with representatives of other National Metrology Institutes, Industries, laboratories and got the chance to see and hear about the state of the art instruments, equipments and measurement systems.