Metrology has always played a key role in the development of society, economy and trade. Precision engineering, micro and nano-Technology has put pressing demands on National Measurement Institutes (NMIs) for the realization of the standards of physical and chemical measurements with highest levels of accuracies and traceability to the international measurement system.

With the liberalization of economy and globalization of trade, considerable efforts are being made in building the confidence that measurements made in one location in the world are compatible/equivalent to those made in other locations on the same or related products.

To have a continual interaction with world class metrologists, NPLI and MSI have jointly been organizing International Conference on Advances in Metrology (AdMet), once every two years since 1996. Last AdMet was organized in December 2006 and was attended by 350 registered participants from 30 countries. Thirty invited talks were delivered by eminent metrologists while 75 oral and 100 poster presentations were made.

Next AdMet (AdMet-2009) will be organized during February, 2009 at New Delhi. As a pre-cursor to this international conference, three workshops in the areas of Photometry & Radiometry, Electrical Energy and Chemical Metrology will be organized during February 16-17, 2009.